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Noise characterisation of MOS transistors in a 0.35 μm CMOS technology of geometries dedicated to front-end circuits for strip detectors
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Journal Title: | Journal of Instrumentation |
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Authors and Corporations: | , |
In: | Journal of Instrumentation, 1, 2006, 11, p. P11001-P11001 |
Type of Resource: | E-Article |
Language: | Undetermined |
published: |
IOP Publishing
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Subjects: |