Eintrag weiter verarbeiten
An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
Gespeichert in:
Zeitschriftentitel: | Semiconductor Science and Technology |
---|---|
Personen und Körperschaften: | , , |
In: | Semiconductor Science and Technology, 22, 2007, 4, S. 348-353 |
Format: | E-Article |
Sprache: | Unbestimmt |
veröffentlicht: |
IOP Publishing
|
Schlagwörter: |
author_facet |
Rodriguez, N Roldán, J B Gámiz, F Rodriguez, N Roldán, J B Gámiz, F |
---|---|
author |
Rodriguez, N Roldán, J B Gámiz, F |
spellingShingle |
Rodriguez, N Roldán, J B Gámiz, F Semiconductor Science and Technology An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms Materials Chemistry Electrical and Electronic Engineering Condensed Matter Physics Electronic, Optical and Magnetic Materials |
author_sort |
rodriguez, n |
spelling |
Rodriguez, N Roldán, J B Gámiz, F 0268-1242 1361-6641 IOP Publishing Materials Chemistry Electrical and Electronic Engineering Condensed Matter Physics Electronic, Optical and Magnetic Materials http://dx.doi.org/10.1088/0268-1242/22/4/009 An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms Semiconductor Science and Technology |
doi_str_mv |
10.1088/0268-1242/22/4/009 |
facet_avail |
Online |
finc_class_facet |
Technik Mathematik Physik Chemie und Pharmazie |
format |
ElectronicArticle |
fullrecord |
blob:ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTA4OC8wMjY4LTEyNDIvMjIvNC8wMDk |
id |
ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTA4OC8wMjY4LTEyNDIvMjIvNC8wMDk |
institution |
DE-Gla1 DE-Zi4 DE-15 DE-Pl11 DE-Rs1 DE-105 DE-14 DE-Ch1 DE-L229 DE-D275 DE-Bn3 DE-Brt1 DE-D161 |
imprint |
IOP Publishing, 2007 |
imprint_str_mv |
IOP Publishing, 2007 |
issn |
0268-1242 1361-6641 |
issn_str_mv |
0268-1242 1361-6641 |
language |
Undetermined |
mega_collection |
IOP Publishing (CrossRef) |
match_str |
rodriguez2007anelectronmobilitymodelforultrathingateoxidemosfetsincludingthecontributionofremotescatteringmechanisms |
publishDateSort |
2007 |
publisher |
IOP Publishing |
recordtype |
ai |
record_format |
ai |
series |
Semiconductor Science and Technology |
source_id |
49 |
title |
An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
title_unstemmed |
An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
title_full |
An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
title_fullStr |
An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
title_full_unstemmed |
An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
title_short |
An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
title_sort |
an electron mobility model for ultra-thin gate-oxide mosfets including the contribution of remote scattering mechanisms |
topic |
Materials Chemistry Electrical and Electronic Engineering Condensed Matter Physics Electronic, Optical and Magnetic Materials |
url |
http://dx.doi.org/10.1088/0268-1242/22/4/009 |
publishDate |
2007 |
physical |
348-353 |
description |
|
container_issue |
4 |
container_start_page |
348 |
container_title |
Semiconductor Science and Technology |
container_volume |
22 |
format_de105 |
Article, E-Article |
format_de14 |
Article, E-Article |
format_de15 |
Article, E-Article |
format_de520 |
Article, E-Article |
format_de540 |
Article, E-Article |
format_dech1 |
Article, E-Article |
format_ded117 |
Article, E-Article |
format_degla1 |
E-Article |
format_del152 |
Buch |
format_del189 |
Article, E-Article |
format_dezi4 |
Article |
format_dezwi2 |
Article, E-Article |
format_finc |
Article, E-Article |
format_nrw |
Article, E-Article |
_version_ |
1792335048708456454 |
geogr_code |
not assigned |
last_indexed |
2024-03-01T14:38:01.007Z |
geogr_code_person |
not assigned |
openURL |
url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fvufind.svn.sourceforge.net%3Agenerator&rft.title=An+electron+mobility+model+for+ultra-thin+gate-oxide+MOSFETs+including+the+contribution+of+remote+scattering+mechanisms&rft.date=2007-04-01&genre=article&issn=1361-6641&volume=22&issue=4&spage=348&epage=353&pages=348-353&jtitle=Semiconductor+Science+and+Technology&atitle=An+electron+mobility+model+for+ultra-thin+gate-oxide+MOSFETs+including+the+contribution+of+remote+scattering+mechanisms&aulast=G%C3%A1miz&aufirst=F&rft_id=info%3Adoi%2F10.1088%2F0268-1242%2F22%2F4%2F009&rft.language%5B0%5D=und |
SOLR | |
_version_ | 1792335048708456454 |
author | Rodriguez, N, Roldán, J B, Gámiz, F |
author_facet | Rodriguez, N, Roldán, J B, Gámiz, F, Rodriguez, N, Roldán, J B, Gámiz, F |
author_sort | rodriguez, n |
container_issue | 4 |
container_start_page | 348 |
container_title | Semiconductor Science and Technology |
container_volume | 22 |
description | |
doi_str_mv | 10.1088/0268-1242/22/4/009 |
facet_avail | Online |
finc_class_facet | Technik, Mathematik, Physik, Chemie und Pharmazie |
format | ElectronicArticle |
format_de105 | Article, E-Article |
format_de14 | Article, E-Article |
format_de15 | Article, E-Article |
format_de520 | Article, E-Article |
format_de540 | Article, E-Article |
format_dech1 | Article, E-Article |
format_ded117 | Article, E-Article |
format_degla1 | E-Article |
format_del152 | Buch |
format_del189 | Article, E-Article |
format_dezi4 | Article |
format_dezwi2 | Article, E-Article |
format_finc | Article, E-Article |
format_nrw | Article, E-Article |
geogr_code | not assigned |
geogr_code_person | not assigned |
id | ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTA4OC8wMjY4LTEyNDIvMjIvNC8wMDk |
imprint | IOP Publishing, 2007 |
imprint_str_mv | IOP Publishing, 2007 |
institution | DE-Gla1, DE-Zi4, DE-15, DE-Pl11, DE-Rs1, DE-105, DE-14, DE-Ch1, DE-L229, DE-D275, DE-Bn3, DE-Brt1, DE-D161 |
issn | 0268-1242, 1361-6641 |
issn_str_mv | 0268-1242, 1361-6641 |
language | Undetermined |
last_indexed | 2024-03-01T14:38:01.007Z |
match_str | rodriguez2007anelectronmobilitymodelforultrathingateoxidemosfetsincludingthecontributionofremotescatteringmechanisms |
mega_collection | IOP Publishing (CrossRef) |
physical | 348-353 |
publishDate | 2007 |
publishDateSort | 2007 |
publisher | IOP Publishing |
record_format | ai |
recordtype | ai |
series | Semiconductor Science and Technology |
source_id | 49 |
spelling | Rodriguez, N Roldán, J B Gámiz, F 0268-1242 1361-6641 IOP Publishing Materials Chemistry Electrical and Electronic Engineering Condensed Matter Physics Electronic, Optical and Magnetic Materials http://dx.doi.org/10.1088/0268-1242/22/4/009 An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms Semiconductor Science and Technology |
spellingShingle | Rodriguez, N, Roldán, J B, Gámiz, F, Semiconductor Science and Technology, An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms, Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials |
title | An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
title_full | An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
title_fullStr | An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
title_full_unstemmed | An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
title_short | An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
title_sort | an electron mobility model for ultra-thin gate-oxide mosfets including the contribution of remote scattering mechanisms |
title_unstemmed | An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms |
topic | Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials |
url | http://dx.doi.org/10.1088/0268-1242/22/4/009 |