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Roldán, J B
Gámiz, F
Rodriguez, N
Roldán, J B
Gámiz, F
author Rodriguez, N
Roldán, J B
Gámiz, F
spellingShingle Rodriguez, N
Roldán, J B
Gámiz, F
Semiconductor Science and Technology
An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
Materials Chemistry
Electrical and Electronic Engineering
Condensed Matter Physics
Electronic, Optical and Magnetic Materials
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title An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
title_unstemmed An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
title_full An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
title_fullStr An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
title_full_unstemmed An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
title_short An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
title_sort an electron mobility model for ultra-thin gate-oxide mosfets including the contribution of remote scattering mechanisms
topic Materials Chemistry
Electrical and Electronic Engineering
Condensed Matter Physics
Electronic, Optical and Magnetic Materials
url http://dx.doi.org/10.1088/0268-1242/22/4/009
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author Rodriguez, N, Roldán, J B, Gámiz, F
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spelling Rodriguez, N Roldán, J B Gámiz, F 0268-1242 1361-6641 IOP Publishing Materials Chemistry Electrical and Electronic Engineering Condensed Matter Physics Electronic, Optical and Magnetic Materials http://dx.doi.org/10.1088/0268-1242/22/4/009 An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms Semiconductor Science and Technology
spellingShingle Rodriguez, N, Roldán, J B, Gámiz, F, Semiconductor Science and Technology, An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms, Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
title An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
title_full An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
title_fullStr An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
title_full_unstemmed An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
title_short An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
title_sort an electron mobility model for ultra-thin gate-oxide mosfets including the contribution of remote scattering mechanisms
title_unstemmed An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
topic Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
url http://dx.doi.org/10.1088/0268-1242/22/4/009