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Limitations of the integrated sub-band-gap absorption for determining the density of defects in amorphous silicon
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Journal Title: | Journal of Applied Physics |
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Authors and Corporations: | , |
In: | Journal of Applied Physics, 67, 1990, 1, p. 578-580 |
Type of Resource: | E-Article |
Language: | English |
published: |
AIP Publishing
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Subjects: |