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Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate

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Bibliographische Detailangaben
Zeitschriftentitel: Advanced Materials Research
Personen und Körperschaften: Mohammed Ali, Mohammed Khalil, Ibrahim, K., Pakhuruddin, M.Z., Faraj, M.G.
In: Advanced Materials Research, 545, 2012, S. 393-398
Format: E-Article
Sprache: Unbestimmt
veröffentlicht:
Trans Tech Publications, Ltd.
Schlagwörter:
General Engineering
author_facet Mohammed Ali, Mohammed Khalil
Ibrahim, K.
Pakhuruddin, M.Z.
Faraj, M.G.
Mohammed Ali, Mohammed Khalil
Ibrahim, K.
Pakhuruddin, M.Z.
Faraj, M.G.
author Mohammed Ali, Mohammed Khalil
Ibrahim, K.
Pakhuruddin, M.Z.
Faraj, M.G.
spellingShingle Mohammed Ali, Mohammed Khalil
Ibrahim, K.
Pakhuruddin, M.Z.
Faraj, M.G.
Advanced Materials Research
Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
General Engineering
author_sort mohammed ali, mohammed khalil
spelling Mohammed Ali, Mohammed Khalil Ibrahim, K. Pakhuruddin, M.Z. Faraj, M.G. 1662-8985 Trans Tech Publications, Ltd. General Engineering http://dx.doi.org/10.4028/www.scientific.net/amr.545.393 <jats:p>This work describe the optical and electrical properties of indium tin oxide (ITO) thin films prepared by thermal evaporation method on flexible plastic substrate (polyethylene terephthalate (PET)). The optical transmission and absorption of ITO films in the visible and UV rang have been studied. The resistivity, sheet resistant, carrier concentration and mobility have been evaluated by Hall Effect measurement. The surface morphology and roughness were investigated by atomic force microscopy (AFM). The results indicate that the optical transmission greater than 85% over the visible rang and it was found to be strongly dependent on the thickness of ITO films. The Resistivity and sheet resistant with low values (10<jats:sup>-4</jats:sup>Ω-cm, 9.22 Ω/ respectively) were obtained and ties values were increased with ITO thin films thickness increasing .AFM investigation showed that the roughness surface of (8 – 30) RMS have been obtained over different thickness of ITO films. The obtained results of the deposited films by this method were analyzed. Details of sample preparation, experimental methods and results are given and discussed.</jats:p> Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate Advanced Materials Research
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source_id 49
title Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
title_unstemmed Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
title_full Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
title_fullStr Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
title_full_unstemmed Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
title_short Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
title_sort optical and electrical properties of indium tin oxide (ito) thin films prepared by thermal evaporation method on polyethylene terephthalate (pet) substrate
topic General Engineering
url http://dx.doi.org/10.4028/www.scientific.net/amr.545.393
publishDate 2012
physical 393-398
description <jats:p>This work describe the optical and electrical properties of indium tin oxide (ITO) thin films prepared by thermal evaporation method on flexible plastic substrate (polyethylene terephthalate (PET)). The optical transmission and absorption of ITO films in the visible and UV rang have been studied. The resistivity, sheet resistant, carrier concentration and mobility have been evaluated by Hall Effect measurement. The surface morphology and roughness were investigated by atomic force microscopy (AFM). The results indicate that the optical transmission greater than 85% over the visible rang and it was found to be strongly dependent on the thickness of ITO films. The Resistivity and sheet resistant with low values (10<jats:sup>-4</jats:sup>Ω-cm, 9.22 Ω/ respectively) were obtained and ties values were increased with ITO thin films thickness increasing .AFM investigation showed that the roughness surface of (8 – 30) RMS have been obtained over different thickness of ITO films. The obtained results of the deposited films by this method were analyzed. Details of sample preparation, experimental methods and results are given and discussed.</jats:p>
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author Mohammed Ali, Mohammed Khalil, Ibrahim, K., Pakhuruddin, M.Z., Faraj, M.G.
author_facet Mohammed Ali, Mohammed Khalil, Ibrahim, K., Pakhuruddin, M.Z., Faraj, M.G., Mohammed Ali, Mohammed Khalil, Ibrahim, K., Pakhuruddin, M.Z., Faraj, M.G.
author_sort mohammed ali, mohammed khalil
container_start_page 393
container_title Advanced Materials Research
container_volume 545
description <jats:p>This work describe the optical and electrical properties of indium tin oxide (ITO) thin films prepared by thermal evaporation method on flexible plastic substrate (polyethylene terephthalate (PET)). The optical transmission and absorption of ITO films in the visible and UV rang have been studied. The resistivity, sheet resistant, carrier concentration and mobility have been evaluated by Hall Effect measurement. The surface morphology and roughness were investigated by atomic force microscopy (AFM). The results indicate that the optical transmission greater than 85% over the visible rang and it was found to be strongly dependent on the thickness of ITO films. The Resistivity and sheet resistant with low values (10<jats:sup>-4</jats:sup>Ω-cm, 9.22 Ω/ respectively) were obtained and ties values were increased with ITO thin films thickness increasing .AFM investigation showed that the roughness surface of (8 – 30) RMS have been obtained over different thickness of ITO films. The obtained results of the deposited films by this method were analyzed. Details of sample preparation, experimental methods and results are given and discussed.</jats:p>
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physical 393-398
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publisher Trans Tech Publications, Ltd.
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series Advanced Materials Research
source_id 49
spelling Mohammed Ali, Mohammed Khalil Ibrahim, K. Pakhuruddin, M.Z. Faraj, M.G. 1662-8985 Trans Tech Publications, Ltd. General Engineering http://dx.doi.org/10.4028/www.scientific.net/amr.545.393 <jats:p>This work describe the optical and electrical properties of indium tin oxide (ITO) thin films prepared by thermal evaporation method on flexible plastic substrate (polyethylene terephthalate (PET)). The optical transmission and absorption of ITO films in the visible and UV rang have been studied. The resistivity, sheet resistant, carrier concentration and mobility have been evaluated by Hall Effect measurement. The surface morphology and roughness were investigated by atomic force microscopy (AFM). The results indicate that the optical transmission greater than 85% over the visible rang and it was found to be strongly dependent on the thickness of ITO films. The Resistivity and sheet resistant with low values (10<jats:sup>-4</jats:sup>Ω-cm, 9.22 Ω/ respectively) were obtained and ties values were increased with ITO thin films thickness increasing .AFM investigation showed that the roughness surface of (8 – 30) RMS have been obtained over different thickness of ITO films. The obtained results of the deposited films by this method were analyzed. Details of sample preparation, experimental methods and results are given and discussed.</jats:p> Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate Advanced Materials Research
spellingShingle Mohammed Ali, Mohammed Khalil, Ibrahim, K., Pakhuruddin, M.Z., Faraj, M.G., Advanced Materials Research, Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate, General Engineering
title Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
title_full Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
title_fullStr Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
title_full_unstemmed Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
title_short Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
title_sort optical and electrical properties of indium tin oxide (ito) thin films prepared by thermal evaporation method on polyethylene terephthalate (pet) substrate
title_unstemmed Optical and Electrical Properties of Indium Tin Oxide (ITO) Thin Films Prepared by Thermal Evaporation Method on Polyethylene Terephthalate (PET) Substrate
topic General Engineering
url http://dx.doi.org/10.4028/www.scientific.net/amr.545.393