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High-resolution dynamic atomic force microscopy in liquids with different feedback architectures
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| Zeitschriftentitel: | Beilstein Journal of Nanotechnology |
|---|---|
| Personen und Körperschaften: | , , , , |
| In: | Beilstein Journal of Nanotechnology, 4, 2013, S. 153-163 |
| Format: | E-Article |
| Sprache: | Englisch |
| veröffentlicht: |
Beilstein Institut
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| Schlagwörter: |
| author_facet |
Melcher, John Martínez-Martín, David Jaafar, Miriam Gómez-Herrero, Julio Raman, Arvind Melcher, John Martínez-Martín, David Jaafar, Miriam Gómez-Herrero, Julio Raman, Arvind |
|---|---|
| author |
Melcher, John Martínez-Martín, David Jaafar, Miriam Gómez-Herrero, Julio Raman, Arvind |
| spellingShingle |
Melcher, John Martínez-Martín, David Jaafar, Miriam Gómez-Herrero, Julio Raman, Arvind Beilstein Journal of Nanotechnology High-resolution dynamic atomic force microscopy in liquids with different feedback architectures Electrical and Electronic Engineering General Physics and Astronomy General Materials Science |
| author_sort |
melcher, john |
| spelling |
Melcher, John Martínez-Martín, David Jaafar, Miriam Gómez-Herrero, Julio Raman, Arvind 2190-4286 Beilstein Institut Electrical and Electronic Engineering General Physics and Astronomy General Materials Science http://dx.doi.org/10.3762/bjnano.4.15 <jats:p>The recent achievement of atomic resolution with dynamic atomic force microscopy (dAFM) [Fukuma et al., <jats:italic>Appl. Phys. Lett.</jats:italic> <jats:bold>2005</jats:bold>, <jats:italic>87</jats:italic>, 034101], where quality factors of the oscillating probe are inherently low, challenges some accepted beliefs concerning sensitivity and resolution in dAFM imaging modes. Through analysis and experiment we study the performance metrics for high-resolution imaging with dAFM in liquid media with amplitude modulation (AM), frequency modulation (FM) and drive-amplitude modulation (DAM) imaging modes. We find that while the quality factors of dAFM probes may deviate by several orders of magnitude between vacuum and liquid media, their sensitivity to tip–sample forces can be remarkable similar. Furthermore, the reduction in noncontact forces and quality factors in liquids diminishes the role of feedback control in achieving high-resolution images. The theoretical findings are supported by atomic-resolution images of mica in water acquired with AM, FM and DAM under similar operating conditions.</jats:p> High-resolution dynamic atomic force microscopy in liquids with different feedback architectures Beilstein Journal of Nanotechnology |
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| title |
High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_unstemmed |
High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_full |
High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_fullStr |
High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_full_unstemmed |
High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_short |
High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_sort |
high-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| topic |
Electrical and Electronic Engineering General Physics and Astronomy General Materials Science |
| url |
http://dx.doi.org/10.3762/bjnano.4.15 |
| publishDate |
2013 |
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153-163 |
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<jats:p>The recent achievement of atomic resolution with dynamic atomic force microscopy (dAFM) [Fukuma et al., <jats:italic>Appl. Phys. Lett.</jats:italic> <jats:bold>2005</jats:bold>, <jats:italic>87</jats:italic>, 034101], where quality factors of the oscillating probe are inherently low, challenges some accepted beliefs concerning sensitivity and resolution in dAFM imaging modes. Through analysis and experiment we study the performance metrics for high-resolution imaging with dAFM in liquid media with amplitude modulation (AM), frequency modulation (FM) and drive-amplitude modulation (DAM) imaging modes. We find that while the quality factors of dAFM probes may deviate by several orders of magnitude between vacuum and liquid media, their sensitivity to tip–sample forces can be remarkable similar. Furthermore, the reduction in noncontact forces and quality factors in liquids diminishes the role of feedback control in achieving high-resolution images. The theoretical findings are supported by atomic-resolution images of mica in water acquired with AM, FM and DAM under similar operating conditions.</jats:p> |
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| author | Melcher, John, Martínez-Martín, David, Jaafar, Miriam, Gómez-Herrero, Julio, Raman, Arvind |
| author_facet | Melcher, John, Martínez-Martín, David, Jaafar, Miriam, Gómez-Herrero, Julio, Raman, Arvind, Melcher, John, Martínez-Martín, David, Jaafar, Miriam, Gómez-Herrero, Julio, Raman, Arvind |
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| description | <jats:p>The recent achievement of atomic resolution with dynamic atomic force microscopy (dAFM) [Fukuma et al., <jats:italic>Appl. Phys. Lett.</jats:italic> <jats:bold>2005</jats:bold>, <jats:italic>87</jats:italic>, 034101], where quality factors of the oscillating probe are inherently low, challenges some accepted beliefs concerning sensitivity and resolution in dAFM imaging modes. Through analysis and experiment we study the performance metrics for high-resolution imaging with dAFM in liquid media with amplitude modulation (AM), frequency modulation (FM) and drive-amplitude modulation (DAM) imaging modes. We find that while the quality factors of dAFM probes may deviate by several orders of magnitude between vacuum and liquid media, their sensitivity to tip–sample forces can be remarkable similar. Furthermore, the reduction in noncontact forces and quality factors in liquids diminishes the role of feedback control in achieving high-resolution images. The theoretical findings are supported by atomic-resolution images of mica in water acquired with AM, FM and DAM under similar operating conditions.</jats:p> |
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| spelling | Melcher, John Martínez-Martín, David Jaafar, Miriam Gómez-Herrero, Julio Raman, Arvind 2190-4286 Beilstein Institut Electrical and Electronic Engineering General Physics and Astronomy General Materials Science http://dx.doi.org/10.3762/bjnano.4.15 <jats:p>The recent achievement of atomic resolution with dynamic atomic force microscopy (dAFM) [Fukuma et al., <jats:italic>Appl. Phys. Lett.</jats:italic> <jats:bold>2005</jats:bold>, <jats:italic>87</jats:italic>, 034101], where quality factors of the oscillating probe are inherently low, challenges some accepted beliefs concerning sensitivity and resolution in dAFM imaging modes. Through analysis and experiment we study the performance metrics for high-resolution imaging with dAFM in liquid media with amplitude modulation (AM), frequency modulation (FM) and drive-amplitude modulation (DAM) imaging modes. We find that while the quality factors of dAFM probes may deviate by several orders of magnitude between vacuum and liquid media, their sensitivity to tip–sample forces can be remarkable similar. Furthermore, the reduction in noncontact forces and quality factors in liquids diminishes the role of feedback control in achieving high-resolution images. The theoretical findings are supported by atomic-resolution images of mica in water acquired with AM, FM and DAM under similar operating conditions.</jats:p> High-resolution dynamic atomic force microscopy in liquids with different feedback architectures Beilstein Journal of Nanotechnology |
| spellingShingle | Melcher, John, Martínez-Martín, David, Jaafar, Miriam, Gómez-Herrero, Julio, Raman, Arvind, Beilstein Journal of Nanotechnology, High-resolution dynamic atomic force microscopy in liquids with different feedback architectures, Electrical and Electronic Engineering, General Physics and Astronomy, General Materials Science |
| title | High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_full | High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_fullStr | High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_full_unstemmed | High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_short | High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_sort | high-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| title_unstemmed | High-resolution dynamic atomic force microscopy in liquids with different feedback architectures |
| topic | Electrical and Electronic Engineering, General Physics and Astronomy, General Materials Science |
| url | http://dx.doi.org/10.3762/bjnano.4.15 |