author_facet Chai, Peng
Li, Shujuan
Li, Yan
Liang, Lie
Yin, Xincheng
Chai, Peng
Li, Shujuan
Li, Yan
Liang, Lie
Yin, Xincheng
author Chai, Peng
Li, Shujuan
Li, Yan
Liang, Lie
Yin, Xincheng
spellingShingle Chai, Peng
Li, Shujuan
Li, Yan
Liang, Lie
Yin, Xincheng
Micromachines
Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
Electrical and Electronic Engineering
Mechanical Engineering
Control and Systems Engineering
author_sort chai, peng
spelling Chai, Peng Li, Shujuan Li, Yan Liang, Lie Yin, Xincheng 2072-666X MDPI AG Electrical and Electronic Engineering Mechanical Engineering Control and Systems Engineering http://dx.doi.org/10.3390/mi11010102 <jats:p>In this paper, theoretical models of the critical indentation depth and critical force on brittle materials using cleavage strength and contact theory are proposed. A Berkovich indenter is adopted for nanoindentation tests on a 4H-SiC single crystal sample to evaluate its mechanical behaviors. The stages of brittle material deformation (elastic, plastic, and brittle) can be characterized by the load versus indentation depth curves through the nanoindentation test. The curve of the elastic deformation stage follows the Hertz contact theory, and plastic deformation occurs at an indentation depth of up to 10 nm. The mechanism of 4H-SiC single crystal cracking is discussed, and the critical indentation depth and critical force for the plastic–brittle transition are obtained through the occurrence of the pop-in point. This shows that the theoretical results have good coherence with the test results. Both the values of the elastic modulus and hardness decrease as the crack length increases. In order to obtain more accurate mechanical property values in the nanoindentation test for brittle materials such as SiC, GaN, and sapphire, an appropriate load that avoids surface cracks should be adopted.</jats:p> Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale Micromachines
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recordtype ai
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series Micromachines
source_id 49
title Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
title_unstemmed Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
title_full Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
title_fullStr Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
title_full_unstemmed Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
title_short Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
title_sort mechanical behavior investigation of 4h-sic single crystal at the micro–nano scale
topic Electrical and Electronic Engineering
Mechanical Engineering
Control and Systems Engineering
url http://dx.doi.org/10.3390/mi11010102
publishDate 2020
physical 102
description <jats:p>In this paper, theoretical models of the critical indentation depth and critical force on brittle materials using cleavage strength and contact theory are proposed. A Berkovich indenter is adopted for nanoindentation tests on a 4H-SiC single crystal sample to evaluate its mechanical behaviors. The stages of brittle material deformation (elastic, plastic, and brittle) can be characterized by the load versus indentation depth curves through the nanoindentation test. The curve of the elastic deformation stage follows the Hertz contact theory, and plastic deformation occurs at an indentation depth of up to 10 nm. The mechanism of 4H-SiC single crystal cracking is discussed, and the critical indentation depth and critical force for the plastic–brittle transition are obtained through the occurrence of the pop-in point. This shows that the theoretical results have good coherence with the test results. Both the values of the elastic modulus and hardness decrease as the crack length increases. In order to obtain more accurate mechanical property values in the nanoindentation test for brittle materials such as SiC, GaN, and sapphire, an appropriate load that avoids surface cracks should be adopted.</jats:p>
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author Chai, Peng, Li, Shujuan, Li, Yan, Liang, Lie, Yin, Xincheng
author_facet Chai, Peng, Li, Shujuan, Li, Yan, Liang, Lie, Yin, Xincheng, Chai, Peng, Li, Shujuan, Li, Yan, Liang, Lie, Yin, Xincheng
author_sort chai, peng
container_issue 1
container_start_page 0
container_title Micromachines
container_volume 11
description <jats:p>In this paper, theoretical models of the critical indentation depth and critical force on brittle materials using cleavage strength and contact theory are proposed. A Berkovich indenter is adopted for nanoindentation tests on a 4H-SiC single crystal sample to evaluate its mechanical behaviors. The stages of brittle material deformation (elastic, plastic, and brittle) can be characterized by the load versus indentation depth curves through the nanoindentation test. The curve of the elastic deformation stage follows the Hertz contact theory, and plastic deformation occurs at an indentation depth of up to 10 nm. The mechanism of 4H-SiC single crystal cracking is discussed, and the critical indentation depth and critical force for the plastic–brittle transition are obtained through the occurrence of the pop-in point. This shows that the theoretical results have good coherence with the test results. Both the values of the elastic modulus and hardness decrease as the crack length increases. In order to obtain more accurate mechanical property values in the nanoindentation test for brittle materials such as SiC, GaN, and sapphire, an appropriate load that avoids surface cracks should be adopted.</jats:p>
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id ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMzM5MC9taTExMDEwMTAy
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source_id 49
spelling Chai, Peng Li, Shujuan Li, Yan Liang, Lie Yin, Xincheng 2072-666X MDPI AG Electrical and Electronic Engineering Mechanical Engineering Control and Systems Engineering http://dx.doi.org/10.3390/mi11010102 <jats:p>In this paper, theoretical models of the critical indentation depth and critical force on brittle materials using cleavage strength and contact theory are proposed. A Berkovich indenter is adopted for nanoindentation tests on a 4H-SiC single crystal sample to evaluate its mechanical behaviors. The stages of brittle material deformation (elastic, plastic, and brittle) can be characterized by the load versus indentation depth curves through the nanoindentation test. The curve of the elastic deformation stage follows the Hertz contact theory, and plastic deformation occurs at an indentation depth of up to 10 nm. The mechanism of 4H-SiC single crystal cracking is discussed, and the critical indentation depth and critical force for the plastic–brittle transition are obtained through the occurrence of the pop-in point. This shows that the theoretical results have good coherence with the test results. Both the values of the elastic modulus and hardness decrease as the crack length increases. In order to obtain more accurate mechanical property values in the nanoindentation test for brittle materials such as SiC, GaN, and sapphire, an appropriate load that avoids surface cracks should be adopted.</jats:p> Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale Micromachines
spellingShingle Chai, Peng, Li, Shujuan, Li, Yan, Liang, Lie, Yin, Xincheng, Micromachines, Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale, Electrical and Electronic Engineering, Mechanical Engineering, Control and Systems Engineering
title Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
title_full Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
title_fullStr Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
title_full_unstemmed Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
title_short Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
title_sort mechanical behavior investigation of 4h-sic single crystal at the micro–nano scale
title_unstemmed Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro–Nano Scale
topic Electrical and Electronic Engineering, Mechanical Engineering, Control and Systems Engineering
url http://dx.doi.org/10.3390/mi11010102