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Inline imaging-ellipsometer for printed electronics
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| Zeitschriftentitel: | tm - Technisches Messen |
|---|---|
| Personen und Körperschaften: | , , , |
| In: | tm - Technisches Messen, 83, 2016, 10, S. 549-556 |
| Format: | E-Article |
| Sprache: | Englisch |
| veröffentlicht: |
Walter de Gruyter GmbH
|
| Schlagwörter: |
| author_facet |
Huemer, Florian Jamalieh, Murad Bammer, Ferdinand Hönig, Dirk Huemer, Florian Jamalieh, Murad Bammer, Ferdinand Hönig, Dirk |
|---|---|
| author |
Huemer, Florian Jamalieh, Murad Bammer, Ferdinand Hönig, Dirk |
| spellingShingle |
Huemer, Florian Jamalieh, Murad Bammer, Ferdinand Hönig, Dirk tm - Technisches Messen Inline imaging-ellipsometer for printed electronics Electrical and Electronic Engineering Instrumentation |
| author_sort |
huemer, florian |
| spelling |
Huemer, Florian Jamalieh, Murad Bammer, Ferdinand Hönig, Dirk 0171-8096 2196-7113 Walter de Gruyter GmbH Electrical and Electronic Engineering Instrumentation http://dx.doi.org/10.1515/teme-2015-0067 <jats:title>Abstract</jats:title> <jats:p>Printed electronics, e.g. organic photo-voltaic, are usually produced by roll-to-roll printing. For this fast growing market no inline-measurement method for 2D-thickness-distributions after printing exists. In many cases layer-thicknesses are in the sub-μm-range, e.g. 10–300 nm, and ellipsometry is one typical technology for this range, but up to now only in the laboratory, since most ellipsometers are too slow and/or measure only a spot. A new concept, a stroboscopic imaging ellipsometer, enables fast measurement on a line, to acquire the 2D-distribution of thickness, right after printing.</jats:p> Inline imaging-ellipsometer for printed electronics tm - Technisches Messen |
| doi_str_mv |
10.1515/teme-2015-0067 |
| facet_avail |
Online |
| finc_class_facet |
Mathematik Physik Allgemeines Technik |
| format |
ElectronicArticle |
| fullrecord |
blob:ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTUxNS90ZW1lLTIwMTUtMDA2Nw |
| id |
ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTUxNS90ZW1lLTIwMTUtMDA2Nw |
| institution |
DE-Zi4 DE-105 DE-14 DE-Ch1 |
| imprint |
Walter de Gruyter GmbH, 2016 |
| imprint_str_mv |
Walter de Gruyter GmbH, 2016 |
| issn |
0171-8096 2196-7113 |
| issn_str_mv |
0171-8096 2196-7113 |
| language |
English |
| mega_collection |
Walter de Gruyter GmbH (CrossRef) |
| match_str |
huemer2016inlineimagingellipsometerforprintedelectronics |
| publishDateSort |
2016 |
| publisher |
Walter de Gruyter GmbH |
| recordtype |
ai |
| record_format |
ai |
| series |
tm - Technisches Messen |
| source_id |
49 |
| title |
Inline imaging-ellipsometer for printed electronics |
| title_unstemmed |
Inline imaging-ellipsometer for printed electronics |
| title_full |
Inline imaging-ellipsometer for printed electronics |
| title_fullStr |
Inline imaging-ellipsometer for printed electronics |
| title_full_unstemmed |
Inline imaging-ellipsometer for printed electronics |
| title_short |
Inline imaging-ellipsometer for printed electronics |
| title_sort |
inline imaging-ellipsometer for printed electronics |
| topic |
Electrical and Electronic Engineering Instrumentation |
| url |
http://dx.doi.org/10.1515/teme-2015-0067 |
| publishDate |
2016 |
| physical |
549-556 |
| description |
<jats:title>Abstract</jats:title>
<jats:p>Printed electronics, e.g. organic photo-voltaic, are usually produced
by roll-to-roll printing. For this fast growing market no
inline-measurement method for 2D-thickness-distributions after
printing exists. In many cases layer-thicknesses are in the
sub-μm-range, e.g. 10–300 nm, and ellipsometry is one typical
technology for this range, but up to now only in the laboratory, since
most ellipsometers are too slow and/or measure only a spot. A new
concept, a stroboscopic imaging ellipsometer, enables fast measurement
on a line, to acquire the 2D-distribution of thickness, right after
printing.</jats:p> |
| container_issue |
10 |
| container_start_page |
549 |
| container_title |
tm - Technisches Messen |
| container_volume |
83 |
| format_de105 |
Article, E-Article |
| format_de14 |
Article, E-Article |
| format_de15 |
Article, E-Article |
| format_de520 |
Article, E-Article |
| format_de540 |
Article, E-Article |
| format_dech1 |
Article, E-Article |
| format_ded117 |
Article, E-Article |
| format_degla1 |
E-Article |
| format_del152 |
Buch |
| format_del189 |
Article, E-Article |
| format_dezi4 |
Article |
| format_dezwi2 |
Article, E-Article |
| format_finc |
Article, E-Article |
| format_nrw |
Article, E-Article |
| _version_ |
1792344422113869836 |
| geogr_code |
not assigned |
| last_indexed |
2024-03-01T17:07:20.621Z |
| geogr_code_person |
not assigned |
| openURL |
url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fvufind.svn.sourceforge.net%3Agenerator&rft.title=Inline+imaging-ellipsometer+for+printed+electronics&rft.date=2016-10-28&genre=article&issn=2196-7113&volume=83&issue=10&spage=549&epage=556&pages=549-556&jtitle=tm+-+Technisches+Messen&atitle=Inline+imaging-ellipsometer+for+printed+electronics&aulast=H%C3%B6nig&aufirst=Dirk&rft_id=info%3Adoi%2F10.1515%2Fteme-2015-0067&rft.language%5B0%5D=eng |
| SOLR | |
| _version_ | 1792344422113869836 |
| author | Huemer, Florian, Jamalieh, Murad, Bammer, Ferdinand, Hönig, Dirk |
| author_facet | Huemer, Florian, Jamalieh, Murad, Bammer, Ferdinand, Hönig, Dirk, Huemer, Florian, Jamalieh, Murad, Bammer, Ferdinand, Hönig, Dirk |
| author_sort | huemer, florian |
| container_issue | 10 |
| container_start_page | 549 |
| container_title | tm - Technisches Messen |
| container_volume | 83 |
| description | <jats:title>Abstract</jats:title> <jats:p>Printed electronics, e.g. organic photo-voltaic, are usually produced by roll-to-roll printing. For this fast growing market no inline-measurement method for 2D-thickness-distributions after printing exists. In many cases layer-thicknesses are in the sub-μm-range, e.g. 10–300 nm, and ellipsometry is one typical technology for this range, but up to now only in the laboratory, since most ellipsometers are too slow and/or measure only a spot. A new concept, a stroboscopic imaging ellipsometer, enables fast measurement on a line, to acquire the 2D-distribution of thickness, right after printing.</jats:p> |
| doi_str_mv | 10.1515/teme-2015-0067 |
| facet_avail | Online |
| finc_class_facet | Mathematik, Physik, Allgemeines, Technik |
| format | ElectronicArticle |
| format_de105 | Article, E-Article |
| format_de14 | Article, E-Article |
| format_de15 | Article, E-Article |
| format_de520 | Article, E-Article |
| format_de540 | Article, E-Article |
| format_dech1 | Article, E-Article |
| format_ded117 | Article, E-Article |
| format_degla1 | E-Article |
| format_del152 | Buch |
| format_del189 | Article, E-Article |
| format_dezi4 | Article |
| format_dezwi2 | Article, E-Article |
| format_finc | Article, E-Article |
| format_nrw | Article, E-Article |
| geogr_code | not assigned |
| geogr_code_person | not assigned |
| id | ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTUxNS90ZW1lLTIwMTUtMDA2Nw |
| imprint | Walter de Gruyter GmbH, 2016 |
| imprint_str_mv | Walter de Gruyter GmbH, 2016 |
| institution | DE-Zi4, DE-105, DE-14, DE-Ch1 |
| issn | 0171-8096, 2196-7113 |
| issn_str_mv | 0171-8096, 2196-7113 |
| language | English |
| last_indexed | 2024-03-01T17:07:20.621Z |
| match_str | huemer2016inlineimagingellipsometerforprintedelectronics |
| mega_collection | Walter de Gruyter GmbH (CrossRef) |
| physical | 549-556 |
| publishDate | 2016 |
| publishDateSort | 2016 |
| publisher | Walter de Gruyter GmbH |
| record_format | ai |
| recordtype | ai |
| series | tm - Technisches Messen |
| source_id | 49 |
| spelling | Huemer, Florian Jamalieh, Murad Bammer, Ferdinand Hönig, Dirk 0171-8096 2196-7113 Walter de Gruyter GmbH Electrical and Electronic Engineering Instrumentation http://dx.doi.org/10.1515/teme-2015-0067 <jats:title>Abstract</jats:title> <jats:p>Printed electronics, e.g. organic photo-voltaic, are usually produced by roll-to-roll printing. For this fast growing market no inline-measurement method for 2D-thickness-distributions after printing exists. In many cases layer-thicknesses are in the sub-μm-range, e.g. 10–300 nm, and ellipsometry is one typical technology for this range, but up to now only in the laboratory, since most ellipsometers are too slow and/or measure only a spot. A new concept, a stroboscopic imaging ellipsometer, enables fast measurement on a line, to acquire the 2D-distribution of thickness, right after printing.</jats:p> Inline imaging-ellipsometer for printed electronics tm - Technisches Messen |
| spellingShingle | Huemer, Florian, Jamalieh, Murad, Bammer, Ferdinand, Hönig, Dirk, tm - Technisches Messen, Inline imaging-ellipsometer for printed electronics, Electrical and Electronic Engineering, Instrumentation |
| title | Inline imaging-ellipsometer for printed electronics |
| title_full | Inline imaging-ellipsometer for printed electronics |
| title_fullStr | Inline imaging-ellipsometer for printed electronics |
| title_full_unstemmed | Inline imaging-ellipsometer for printed electronics |
| title_short | Inline imaging-ellipsometer for printed electronics |
| title_sort | inline imaging-ellipsometer for printed electronics |
| title_unstemmed | Inline imaging-ellipsometer for printed electronics |
| topic | Electrical and Electronic Engineering, Instrumentation |
| url | http://dx.doi.org/10.1515/teme-2015-0067 |