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Investigation on High-κ Dielectric for Low Leakage AlGaN/GaN MIS-HEMT Device, Using Material Selection Methodologies
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Journal Title: | Semiconductors |
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Authors and Corporations: | , , |
In: | Semiconductors, 52, 2018, 4, p. 420-430 |
Type of Resource: | E-Article |
Language: | English |
published: |
Pleiades Publishing Ltd
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Subjects: |