Further processing options
Improved lateral force calibration based on the angle conversion factor in atomic force microscopy
Saved in:
Journal Title: | Journal of Microscopy |
---|---|
Authors and Corporations: | , , |
In: | Journal of Microscopy, 228, 2007, 2, p. 190-199 |
Type of Resource: | E-Article |
Language: | English |
published: |
Wiley
|
Subjects: |