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Improved lateral force calibration based on the angle conversion factor in atomic force microscopy
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| Zeitschriftentitel: | Journal of Microscopy |
|---|---|
| Personen und Körperschaften: | , , |
| In: | Journal of Microscopy, 228, 2007, 2, S. 190-199 |
| Format: | E-Article |
| Sprache: | Englisch |
| veröffentlicht: |
Wiley
|
| Schlagwörter: |
| author_facet |
CHOI, DUKHYUN HWANG, WOONBONG YOON, EUISUNG CHOI, DUKHYUN HWANG, WOONBONG YOON, EUISUNG |
|---|---|
| author |
CHOI, DUKHYUN HWANG, WOONBONG YOON, EUISUNG |
| spellingShingle |
CHOI, DUKHYUN HWANG, WOONBONG YOON, EUISUNG Journal of Microscopy Improved lateral force calibration based on the angle conversion factor in atomic force microscopy Histology Pathology and Forensic Medicine |
| author_sort |
choi, dukhyun |
| spelling |
CHOI, DUKHYUN HWANG, WOONBONG YOON, EUISUNG 0022-2720 1365-2818 Wiley Histology Pathology and Forensic Medicine http://dx.doi.org/10.1111/j.1365-2818.2007.01837.x <jats:title>Summary</jats:title><jats:p>A novel calibration method is proposed for determining lateral forces in atomic force microscopy (AFM), by introducing an angle conversion factor, which is defined as the ratio of the twist angle of a cantilever to the corresponding lateral signal. This factor greatly simplifies the calibration procedures. Once the angle conversion factor is determined in AFM, the lateral force calibration factors of any rectangular cantilever can be obtained by simple computation without further experiments. To determine the angle conversion factor, this study focuses on the determination of the twist angle of a cantilever during lateral force calibration in AFM. Since the twist angle of a cantilever cannot be directly measured in AFM, the angles are obtained by means of the moment balance equations between a rectangular AFM cantilever and a simple commercially available step grating. To eliminate the effect of the adhesive force, the gradients of the lateral signals and the twist angles as a function of normal force are used in calculating the angle conversion factor. To verify reliability and reproducibility of the method, two step gratings with different heights and two different rectangular cantilevers were used in lateral force calibration in AFM. The results showed good agreement, to within 10%. This method was validated by comparing the coefficient of friction of mica so determined with values in the literature.</jats:p> Improved lateral force calibration based on the angle conversion factor in atomic force microscopy Journal of Microscopy |
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Journal of Microscopy |
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| title |
Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_unstemmed |
Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_full |
Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_fullStr |
Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_full_unstemmed |
Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_short |
Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_sort |
improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| topic |
Histology Pathology and Forensic Medicine |
| url |
http://dx.doi.org/10.1111/j.1365-2818.2007.01837.x |
| publishDate |
2007 |
| physical |
190-199 |
| description |
<jats:title>Summary</jats:title><jats:p>A novel calibration method is proposed for determining lateral forces in atomic force microscopy (AFM), by introducing an angle conversion factor, which is defined as the ratio of the twist angle of a cantilever to the corresponding lateral signal. This factor greatly simplifies the calibration procedures. Once the angle conversion factor is determined in AFM, the lateral force calibration factors of any rectangular cantilever can be obtained by simple computation without further experiments. To determine the angle conversion factor, this study focuses on the determination of the twist angle of a cantilever during lateral force calibration in AFM. Since the twist angle of a cantilever cannot be directly measured in AFM, the angles are obtained by means of the moment balance equations between a rectangular AFM cantilever and a simple commercially available step grating. To eliminate the effect of the adhesive force, the gradients of the lateral signals and the twist angles as a function of normal force are used in calculating the angle conversion factor. To verify reliability and reproducibility of the method, two step gratings with different heights and two different rectangular cantilevers were used in lateral force calibration in AFM. The results showed good agreement, to within 10%. This method was validated by comparing the coefficient of friction of mica so determined with values in the literature.</jats:p> |
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| author | CHOI, DUKHYUN, HWANG, WOONBONG, YOON, EUISUNG |
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| description | <jats:title>Summary</jats:title><jats:p>A novel calibration method is proposed for determining lateral forces in atomic force microscopy (AFM), by introducing an angle conversion factor, which is defined as the ratio of the twist angle of a cantilever to the corresponding lateral signal. This factor greatly simplifies the calibration procedures. Once the angle conversion factor is determined in AFM, the lateral force calibration factors of any rectangular cantilever can be obtained by simple computation without further experiments. To determine the angle conversion factor, this study focuses on the determination of the twist angle of a cantilever during lateral force calibration in AFM. Since the twist angle of a cantilever cannot be directly measured in AFM, the angles are obtained by means of the moment balance equations between a rectangular AFM cantilever and a simple commercially available step grating. To eliminate the effect of the adhesive force, the gradients of the lateral signals and the twist angles as a function of normal force are used in calculating the angle conversion factor. To verify reliability and reproducibility of the method, two step gratings with different heights and two different rectangular cantilevers were used in lateral force calibration in AFM. The results showed good agreement, to within 10%. This method was validated by comparing the coefficient of friction of mica so determined with values in the literature.</jats:p> |
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| spelling | CHOI, DUKHYUN HWANG, WOONBONG YOON, EUISUNG 0022-2720 1365-2818 Wiley Histology Pathology and Forensic Medicine http://dx.doi.org/10.1111/j.1365-2818.2007.01837.x <jats:title>Summary</jats:title><jats:p>A novel calibration method is proposed for determining lateral forces in atomic force microscopy (AFM), by introducing an angle conversion factor, which is defined as the ratio of the twist angle of a cantilever to the corresponding lateral signal. This factor greatly simplifies the calibration procedures. Once the angle conversion factor is determined in AFM, the lateral force calibration factors of any rectangular cantilever can be obtained by simple computation without further experiments. To determine the angle conversion factor, this study focuses on the determination of the twist angle of a cantilever during lateral force calibration in AFM. Since the twist angle of a cantilever cannot be directly measured in AFM, the angles are obtained by means of the moment balance equations between a rectangular AFM cantilever and a simple commercially available step grating. To eliminate the effect of the adhesive force, the gradients of the lateral signals and the twist angles as a function of normal force are used in calculating the angle conversion factor. To verify reliability and reproducibility of the method, two step gratings with different heights and two different rectangular cantilevers were used in lateral force calibration in AFM. The results showed good agreement, to within 10%. This method was validated by comparing the coefficient of friction of mica so determined with values in the literature.</jats:p> Improved lateral force calibration based on the angle conversion factor in atomic force microscopy Journal of Microscopy |
| spellingShingle | CHOI, DUKHYUN, HWANG, WOONBONG, YOON, EUISUNG, Journal of Microscopy, Improved lateral force calibration based on the angle conversion factor in atomic force microscopy, Histology, Pathology and Forensic Medicine |
| title | Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_full | Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_fullStr | Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_full_unstemmed | Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_short | Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_sort | improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| title_unstemmed | Improved lateral force calibration based on the angle conversion factor in atomic force microscopy |
| topic | Histology, Pathology and Forensic Medicine |
| url | http://dx.doi.org/10.1111/j.1365-2818.2007.01837.x |