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Transition delay fault test pattern generation considering supply voltage noise in a SOC design
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| Zeitschriftentitel: | Proceedings of the 44th annual conference on Design automation - DAC '07 |
|---|---|
| Personen und Körperschaften: | , , |
| In: | Proceedings of the 44th annual conference on Design automation - DAC '07, 2007 |
| Format: | E-Proceedings |
| Sprache: | Unbestimmt |
| veröffentlicht: |
ACM Press
|
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Ahmed, Nisar Tehranipoor, Mohammad Jayaram, Vinay Ahmed, Nisar Tehranipoor, Mohammad Jayaram, Vinay |
|---|---|
| author |
Ahmed, Nisar Tehranipoor, Mohammad Jayaram, Vinay |
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Ahmed, Nisar Tehranipoor, Mohammad Jayaram, Vinay Proceedings of the 44th annual conference on Design automation - DAC '07 Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
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ahmed, nisar |
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Ahmed, Nisar Tehranipoor, Mohammad Jayaram, Vinay 0738-100X ACM Press http://dx.doi.org/10.1145/1278480.1278616 Transition delay fault test pattern generation considering supply voltage noise in a SOC design Proceedings of the 44th annual conference on Design automation - DAC '07 |
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ACM Press, 2007 |
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Proceedings of the 44th annual conference on Design automation - DAC '07 |
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Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
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Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
| title_full |
Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
| title_fullStr |
Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
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Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
| title_short |
Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
| title_sort |
transition delay fault test pattern generation considering supply voltage noise in a soc design |
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http://dx.doi.org/10.1145/1278480.1278616 |
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2007 |
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| author | Ahmed, Nisar, Tehranipoor, Mohammad, Jayaram, Vinay |
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| spelling | Ahmed, Nisar Tehranipoor, Mohammad Jayaram, Vinay 0738-100X ACM Press http://dx.doi.org/10.1145/1278480.1278616 Transition delay fault test pattern generation considering supply voltage noise in a SOC design Proceedings of the 44th annual conference on Design automation - DAC '07 |
| spellingShingle | Ahmed, Nisar, Tehranipoor, Mohammad, Jayaram, Vinay, Proceedings of the 44th annual conference on Design automation - DAC '07, Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
| title | Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
| title_full | Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
| title_fullStr | Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
| title_full_unstemmed | Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
| title_short | Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
| title_sort | transition delay fault test pattern generation considering supply voltage noise in a soc design |
| title_unstemmed | Transition delay fault test pattern generation considering supply voltage noise in a SOC design |
| url | http://dx.doi.org/10.1145/1278480.1278616 |