Eintrag weiter verarbeiten
Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats
Gespeichert in:
| Zeitschriftentitel: | Surface and Interface Analysis |
|---|---|
| Personen und Körperschaften: | |
| In: | Surface and Interface Analysis, 33, 2002, 4, S. 367-368 |
| Format: | E-Article |
| Sprache: | Englisch |
| veröffentlicht: |
Wiley
|
| Schlagwörter: |
| author_facet |
Yoshihara, K. Yoshihara, K. |
|---|---|
| author |
Yoshihara, K. |
| spellingShingle |
Yoshihara, K. Surface and Interface Analysis Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats Materials Chemistry Surfaces, Coatings and Films Surfaces and Interfaces Condensed Matter Physics General Chemistry |
| author_sort |
yoshihara, k. |
| spelling |
Yoshihara, K. 0142-2421 1096-9918 Wiley Materials Chemistry Surfaces, Coatings and Films Surfaces and Interfaces Condensed Matter Physics General Chemistry http://dx.doi.org/10.1002/sia.1193 <jats:title>Abstract</jats:title><jats:p>This International Standard specifies a format to supplement ISO 14976: <jats:italic>Surface chemical analysis—Data transfer format to transfer data for creation, expansion and revision of a surface chemical analysis spectral database</jats:italic>. The format is applied to Auger electron spectroscopy(AES) and x‐ray photoelectron spectroscopy (XPS) spectral data. Copyright © 2002 John Wiley & Sons, Ltd.</jats:p> Summary of ISO/TC 201 Standard: V ISO 14975:2000—<i>Surface chemical analysis</i>—<i>Data information formats</i> Surface and Interface Analysis |
| doi_str_mv |
10.1002/sia.1193 |
| facet_avail |
Online |
| finc_class_facet |
Physik Chemie und Pharmazie Allgemeines Technik |
| format |
ElectronicArticle |
| fullrecord |
blob:ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTAwMi9zaWEuMTE5Mw |
| id |
ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTAwMi9zaWEuMTE5Mw |
| institution |
DE-15 DE-Pl11 DE-Rs1 DE-105 DE-14 DE-Ch1 DE-L229 DE-D275 DE-Bn3 DE-Brt1 DE-D161 DE-Gla1 DE-Zi4 |
| imprint |
Wiley, 2002 |
| imprint_str_mv |
Wiley, 2002 |
| issn |
0142-2421 1096-9918 |
| issn_str_mv |
0142-2421 1096-9918 |
| language |
English |
| mega_collection |
Wiley (CrossRef) |
| match_str |
yoshihara2002summaryofisotc201standardviso149752000surfacechemicalanalysisdatainformationformats |
| publishDateSort |
2002 |
| publisher |
Wiley |
| recordtype |
ai |
| record_format |
ai |
| series |
Surface and Interface Analysis |
| source_id |
49 |
| title |
Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| title_unstemmed |
Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| title_full |
Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| title_fullStr |
Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| title_full_unstemmed |
Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| title_short |
Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| title_sort |
summary of iso/tc 201 standard: v iso 14975:2000—<i>surface chemical analysis</i>—<i>data information formats</i> |
| topic |
Materials Chemistry Surfaces, Coatings and Films Surfaces and Interfaces Condensed Matter Physics General Chemistry |
| url |
http://dx.doi.org/10.1002/sia.1193 |
| publishDate |
2002 |
| physical |
367-368 |
| description |
<jats:title>Abstract</jats:title><jats:p>This International Standard specifies a format to supplement ISO 14976: <jats:italic>Surface chemical analysis—Data transfer format to transfer data for creation, expansion and revision of a surface chemical analysis spectral database</jats:italic>. The format is applied to Auger electron spectroscopy(AES) and x‐ray photoelectron spectroscopy (XPS) spectral data. Copyright © 2002 John Wiley & Sons, Ltd.</jats:p> |
| container_issue |
4 |
| container_start_page |
367 |
| container_title |
Surface and Interface Analysis |
| container_volume |
33 |
| format_de105 |
Article, E-Article |
| format_de14 |
Article, E-Article |
| format_de15 |
Article, E-Article |
| format_de520 |
Article, E-Article |
| format_de540 |
Article, E-Article |
| format_dech1 |
Article, E-Article |
| format_ded117 |
Article, E-Article |
| format_degla1 |
E-Article |
| format_del152 |
Buch |
| format_del189 |
Article, E-Article |
| format_dezi4 |
Article |
| format_dezwi2 |
Article, E-Article |
| format_finc |
Article, E-Article |
| format_nrw |
Article, E-Article |
| _version_ |
1792338513426907136 |
| geogr_code |
not assigned |
| last_indexed |
2024-03-01T15:33:22.882Z |
| geogr_code_person |
not assigned |
| openURL |
url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fvufind.svn.sourceforge.net%3Agenerator&rft.title=Summary+of+ISO%2FTC+201+Standard%3A+V+ISO+14975%3A2000%E2%80%94Surface+chemical+analysis%E2%80%94Data+information+formats&rft.date=2002-04-01&genre=article&issn=1096-9918&volume=33&issue=4&spage=367&epage=368&pages=367-368&jtitle=Surface+and+Interface+Analysis&atitle=Summary+of+ISO%2FTC+201+Standard%3A+V+ISO+14975%3A2000%E2%80%94%3Ci%3ESurface+chemical+analysis%3C%2Fi%3E%E2%80%94%3Ci%3EData+information+formats%3C%2Fi%3E&aulast=Yoshihara&aufirst=K.&rft_id=info%3Adoi%2F10.1002%2Fsia.1193&rft.language%5B0%5D=eng |
| SOLR | |
| _version_ | 1792338513426907136 |
| author | Yoshihara, K. |
| author_facet | Yoshihara, K., Yoshihara, K. |
| author_sort | yoshihara, k. |
| container_issue | 4 |
| container_start_page | 367 |
| container_title | Surface and Interface Analysis |
| container_volume | 33 |
| description | <jats:title>Abstract</jats:title><jats:p>This International Standard specifies a format to supplement ISO 14976: <jats:italic>Surface chemical analysis—Data transfer format to transfer data for creation, expansion and revision of a surface chemical analysis spectral database</jats:italic>. The format is applied to Auger electron spectroscopy(AES) and x‐ray photoelectron spectroscopy (XPS) spectral data. Copyright © 2002 John Wiley & Sons, Ltd.</jats:p> |
| doi_str_mv | 10.1002/sia.1193 |
| facet_avail | Online |
| finc_class_facet | Physik, Chemie und Pharmazie, Allgemeines, Technik |
| format | ElectronicArticle |
| format_de105 | Article, E-Article |
| format_de14 | Article, E-Article |
| format_de15 | Article, E-Article |
| format_de520 | Article, E-Article |
| format_de540 | Article, E-Article |
| format_dech1 | Article, E-Article |
| format_ded117 | Article, E-Article |
| format_degla1 | E-Article |
| format_del152 | Buch |
| format_del189 | Article, E-Article |
| format_dezi4 | Article |
| format_dezwi2 | Article, E-Article |
| format_finc | Article, E-Article |
| format_nrw | Article, E-Article |
| geogr_code | not assigned |
| geogr_code_person | not assigned |
| id | ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTAwMi9zaWEuMTE5Mw |
| imprint | Wiley, 2002 |
| imprint_str_mv | Wiley, 2002 |
| institution | DE-15, DE-Pl11, DE-Rs1, DE-105, DE-14, DE-Ch1, DE-L229, DE-D275, DE-Bn3, DE-Brt1, DE-D161, DE-Gla1, DE-Zi4 |
| issn | 0142-2421, 1096-9918 |
| issn_str_mv | 0142-2421, 1096-9918 |
| language | English |
| last_indexed | 2024-03-01T15:33:22.882Z |
| match_str | yoshihara2002summaryofisotc201standardviso149752000surfacechemicalanalysisdatainformationformats |
| mega_collection | Wiley (CrossRef) |
| physical | 367-368 |
| publishDate | 2002 |
| publishDateSort | 2002 |
| publisher | Wiley |
| record_format | ai |
| recordtype | ai |
| series | Surface and Interface Analysis |
| source_id | 49 |
| spelling | Yoshihara, K. 0142-2421 1096-9918 Wiley Materials Chemistry Surfaces, Coatings and Films Surfaces and Interfaces Condensed Matter Physics General Chemistry http://dx.doi.org/10.1002/sia.1193 <jats:title>Abstract</jats:title><jats:p>This International Standard specifies a format to supplement ISO 14976: <jats:italic>Surface chemical analysis—Data transfer format to transfer data for creation, expansion and revision of a surface chemical analysis spectral database</jats:italic>. The format is applied to Auger electron spectroscopy(AES) and x‐ray photoelectron spectroscopy (XPS) spectral data. Copyright © 2002 John Wiley & Sons, Ltd.</jats:p> Summary of ISO/TC 201 Standard: V ISO 14975:2000—<i>Surface chemical analysis</i>—<i>Data information formats</i> Surface and Interface Analysis |
| spellingShingle | Yoshihara, K., Surface and Interface Analysis, Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats, Materials Chemistry, Surfaces, Coatings and Films, Surfaces and Interfaces, Condensed Matter Physics, General Chemistry |
| title | Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| title_full | Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| title_fullStr | Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| title_full_unstemmed | Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| title_short | Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| title_sort | summary of iso/tc 201 standard: v iso 14975:2000—<i>surface chemical analysis</i>—<i>data information formats</i> |
| title_unstemmed | Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats |
| topic | Materials Chemistry, Surfaces, Coatings and Films, Surfaces and Interfaces, Condensed Matter Physics, General Chemistry |
| url | http://dx.doi.org/10.1002/sia.1193 |