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New developments in electron energy loss spectroscopy
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| Zeitschriftentitel: | Microscopy Research and Technique |
|---|---|
| Personen und Körperschaften: | , |
| In: | Microscopy Research and Technique, 70, 2007, 3, S. 211-219 |
| Format: | E-Article |
| Sprache: | Englisch |
| veröffentlicht: |
Wiley
|
| Schlagwörter: |
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Keast, V.J. Bosman, M. Keast, V.J. Bosman, M. |
|---|---|
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Keast, V.J. Bosman, M. |
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Keast, V.J. Bosman, M. Microscopy Research and Technique New developments in electron energy loss spectroscopy Medical Laboratory Technology Instrumentation Histology Anatomy |
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keast, v.j. |
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Keast, V.J. Bosman, M. 1059-910X 1097-0029 Wiley Medical Laboratory Technology Instrumentation Histology Anatomy http://dx.doi.org/10.1002/jemt.20407 <jats:title>Abstract</jats:title><jats:p>In the electron microscope, spectroscopic signals such as the characteristic X‐rays or the energy loss of the incident beam can provide an analysis of the local composition or electronic structure. Recent improvements in the energy resolution and sensitivity of electron spectrometers have improved the quality of spectra that can be obtained. Concurrently, the calculations used to simulate and interpret spectra have made major advances. These developments will be briefly reviewed. In recent years, the focus of analytical electron microscopy has moved away from single spectrum acquisition to mapping and imaging. In particular, the use of spectrum imaging (SI), where a full spectrum is acquired and stored at each pixel in the image is becoming widespread. A challenge for the application of spectrum imaging is the processing of such large datasets in order to extract the significant information. When we go beyond the mapping of composition and look to map bonding and electronic structure this becomes both more important and more difficult. Approaches to processing spectrum imaging data sets acquired using electron energy loss spectroscopy (EELS) will be explored in this paper. Microsc. Res. Tech., 2007. © 2007 Wiley‐Liss, Inc.</jats:p> New developments in electron energy loss spectroscopy Microscopy Research and Technique |
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New developments in electron energy loss spectroscopy |
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New developments in electron energy loss spectroscopy |
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New developments in electron energy loss spectroscopy |
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new developments in electron energy loss spectroscopy |
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Medical Laboratory Technology Instrumentation Histology Anatomy |
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211-219 |
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<jats:title>Abstract</jats:title><jats:p>In the electron microscope, spectroscopic signals such as the characteristic X‐rays or the energy loss of the incident beam can provide an analysis of the local composition or electronic structure. Recent improvements in the energy resolution and sensitivity of electron spectrometers have improved the quality of spectra that can be obtained. Concurrently, the calculations used to simulate and interpret spectra have made major advances. These developments will be briefly reviewed. In recent years, the focus of analytical electron microscopy has moved away from single spectrum acquisition to mapping and imaging. In particular, the use of spectrum imaging (SI), where a full spectrum is acquired and stored at each pixel in the image is becoming widespread. A challenge for the application of spectrum imaging is the processing of such large datasets in order to extract the significant information. When we go beyond the mapping of composition and look to map bonding and electronic structure this becomes both more important and more difficult. Approaches to processing spectrum imaging data sets acquired using electron energy loss spectroscopy (EELS) will be explored in this paper. Microsc. Res. Tech., 2007. © 2007 Wiley‐Liss, Inc.</jats:p> |
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| description | <jats:title>Abstract</jats:title><jats:p>In the electron microscope, spectroscopic signals such as the characteristic X‐rays or the energy loss of the incident beam can provide an analysis of the local composition or electronic structure. Recent improvements in the energy resolution and sensitivity of electron spectrometers have improved the quality of spectra that can be obtained. Concurrently, the calculations used to simulate and interpret spectra have made major advances. These developments will be briefly reviewed. In recent years, the focus of analytical electron microscopy has moved away from single spectrum acquisition to mapping and imaging. In particular, the use of spectrum imaging (SI), where a full spectrum is acquired and stored at each pixel in the image is becoming widespread. A challenge for the application of spectrum imaging is the processing of such large datasets in order to extract the significant information. When we go beyond the mapping of composition and look to map bonding and electronic structure this becomes both more important and more difficult. Approaches to processing spectrum imaging data sets acquired using electron energy loss spectroscopy (EELS) will be explored in this paper. Microsc. Res. Tech., 2007. © 2007 Wiley‐Liss, Inc.</jats:p> |
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| spelling | Keast, V.J. Bosman, M. 1059-910X 1097-0029 Wiley Medical Laboratory Technology Instrumentation Histology Anatomy http://dx.doi.org/10.1002/jemt.20407 <jats:title>Abstract</jats:title><jats:p>In the electron microscope, spectroscopic signals such as the characteristic X‐rays or the energy loss of the incident beam can provide an analysis of the local composition or electronic structure. Recent improvements in the energy resolution and sensitivity of electron spectrometers have improved the quality of spectra that can be obtained. Concurrently, the calculations used to simulate and interpret spectra have made major advances. These developments will be briefly reviewed. In recent years, the focus of analytical electron microscopy has moved away from single spectrum acquisition to mapping and imaging. In particular, the use of spectrum imaging (SI), where a full spectrum is acquired and stored at each pixel in the image is becoming widespread. A challenge for the application of spectrum imaging is the processing of such large datasets in order to extract the significant information. When we go beyond the mapping of composition and look to map bonding and electronic structure this becomes both more important and more difficult. Approaches to processing spectrum imaging data sets acquired using electron energy loss spectroscopy (EELS) will be explored in this paper. Microsc. Res. Tech., 2007. © 2007 Wiley‐Liss, Inc.</jats:p> New developments in electron energy loss spectroscopy Microscopy Research and Technique |
| spellingShingle | Keast, V.J., Bosman, M., Microscopy Research and Technique, New developments in electron energy loss spectroscopy, Medical Laboratory Technology, Instrumentation, Histology, Anatomy |
| title | New developments in electron energy loss spectroscopy |
| title_full | New developments in electron energy loss spectroscopy |
| title_fullStr | New developments in electron energy loss spectroscopy |
| title_full_unstemmed | New developments in electron energy loss spectroscopy |
| title_short | New developments in electron energy loss spectroscopy |
| title_sort | new developments in electron energy loss spectroscopy |
| title_unstemmed | New developments in electron energy loss spectroscopy |
| topic | Medical Laboratory Technology, Instrumentation, Histology, Anatomy |
| url | http://dx.doi.org/10.1002/jemt.20407 |