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Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements
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Journal Title: | Journal of Physics: Conference Series |
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Authors and Corporations: | , , , |
In: | Journal of Physics: Conference Series, 1015, 2018, p. 022018 |
Type of Resource: | E-Article |
Language: | Undetermined |
published: |
IOP Publishing
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Subjects: |