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Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements
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| Zeitschriftentitel: | Journal of Physics: Conference Series |
|---|---|
| Personen und Körperschaften: | , , , |
| In: | Journal of Physics: Conference Series, 1015, 2018, S. 022018 |
| Format: | E-Article |
| Sprache: | Unbestimmt |
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IOP Publishing
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Savin, A A Guba, V G Ladur, A A Bykova, O N Savin, A A Guba, V G Ladur, A A Bykova, O N |
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Savin, A A Guba, V G Ladur, A A Bykova, O N |
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Savin, A A Guba, V G Ladur, A A Bykova, O N Journal of Physics: Conference Series Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements General Physics and Astronomy |
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Savin, A A Guba, V G Ladur, A A Bykova, O N 1742-6588 1742-6596 IOP Publishing General Physics and Astronomy http://dx.doi.org/10.1088/1742-6596/1015/2/022018 Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements Journal of Physics: Conference Series |
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Journal of Physics: Conference Series |
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Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
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Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
| title_full |
Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
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Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
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Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
| title_short |
Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
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method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
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General Physics and Astronomy |
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| spelling | Savin, A A Guba, V G Ladur, A A Bykova, O N 1742-6588 1742-6596 IOP Publishing General Physics and Astronomy http://dx.doi.org/10.1088/1742-6596/1015/2/022018 Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements Journal of Physics: Conference Series |
| spellingShingle | Savin, A A, Guba, V G, Ladur, A A, Bykova, O N, Journal of Physics: Conference Series, Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements, General Physics and Astronomy |
| title | Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
| title_full | Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
| title_fullStr | Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
| title_full_unstemmed | Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
| title_short | Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
| title_sort | method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
| title_unstemmed | Method of printed circuits and semiconductor substrates material parameters extraction using wideband reflection measurements |
| topic | General Physics and Astronomy |
| url | http://dx.doi.org/10.1088/1742-6596/1015/2/022018 |