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Scanning tunnelling microscopy: application to field electron emission studies
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Journal Title: | Journal of Physics D: Applied Physics |
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Authors and Corporations: | , , , , |
In: | Journal of Physics D: Applied Physics, 32, 1999, 7, p. 815-819 |
Type of Resource: | E-Article |
Language: | Undetermined |
published: |
IOP Publishing
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Subjects: |