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Scanning tunnelling microscopy: application to field electron emission studies
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Zeitschriftentitel: | Journal of Physics D: Applied Physics |
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Personen und Körperschaften: | , , , , |
In: | Journal of Physics D: Applied Physics, 32, 1999, 7, S. 815-819 |
Format: | E-Article |
Sprache: | Unbestimmt |
veröffentlicht: |
IOP Publishing
|
Schlagwörter: |
author_facet |
Frolov, V D Karabutov, A V Konov, V I Pimenov, S M Prokhorov, A M Frolov, V D Karabutov, A V Konov, V I Pimenov, S M Prokhorov, A M |
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author |
Frolov, V D Karabutov, A V Konov, V I Pimenov, S M Prokhorov, A M |
spellingShingle |
Frolov, V D Karabutov, A V Konov, V I Pimenov, S M Prokhorov, A M Journal of Physics D: Applied Physics Scanning tunnelling microscopy: application to field electron emission studies Surfaces, Coatings and Films Acoustics and Ultrasonics Condensed Matter Physics Electronic, Optical and Magnetic Materials |
author_sort |
frolov, v d |
spelling |
Frolov, V D Karabutov, A V Konov, V I Pimenov, S M Prokhorov, A M 0022-3727 1361-6463 IOP Publishing Surfaces, Coatings and Films Acoustics and Ultrasonics Condensed Matter Physics Electronic, Optical and Magnetic Materials http://dx.doi.org/10.1088/0022-3727/32/7/010 Scanning tunnelling microscopy: application to field electron emission studies Journal of Physics D: Applied Physics |
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10.1088/0022-3727/32/7/010 |
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IOP Publishing, 1999 |
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IOP Publishing, 1999 |
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0022-3727 1361-6463 |
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0022-3727 1361-6463 |
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1999 |
publisher |
IOP Publishing |
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ai |
record_format |
ai |
series |
Journal of Physics D: Applied Physics |
source_id |
49 |
title |
Scanning tunnelling microscopy: application to field electron emission studies |
title_unstemmed |
Scanning tunnelling microscopy: application to field electron emission studies |
title_full |
Scanning tunnelling microscopy: application to field electron emission studies |
title_fullStr |
Scanning tunnelling microscopy: application to field electron emission studies |
title_full_unstemmed |
Scanning tunnelling microscopy: application to field electron emission studies |
title_short |
Scanning tunnelling microscopy: application to field electron emission studies |
title_sort |
scanning tunnelling microscopy: application to field electron emission studies |
topic |
Surfaces, Coatings and Films Acoustics and Ultrasonics Condensed Matter Physics Electronic, Optical and Magnetic Materials |
url |
http://dx.doi.org/10.1088/0022-3727/32/7/010 |
publishDate |
1999 |
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815-819 |
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author | Frolov, V D, Karabutov, A V, Konov, V I, Pimenov, S M, Prokhorov, A M |
author_facet | Frolov, V D, Karabutov, A V, Konov, V I, Pimenov, S M, Prokhorov, A M, Frolov, V D, Karabutov, A V, Konov, V I, Pimenov, S M, Prokhorov, A M |
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container_title | Journal of Physics D: Applied Physics |
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imprint | IOP Publishing, 1999 |
imprint_str_mv | IOP Publishing, 1999 |
institution | DE-Gla1, DE-Zi4, DE-15, DE-Pl11, DE-Rs1, DE-105, DE-14, DE-Ch1, DE-L229, DE-D275, DE-Bn3, DE-Brt1, DE-D161 |
issn | 0022-3727, 1361-6463 |
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language | Undetermined |
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physical | 815-819 |
publishDate | 1999 |
publishDateSort | 1999 |
publisher | IOP Publishing |
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recordtype | ai |
series | Journal of Physics D: Applied Physics |
source_id | 49 |
spelling | Frolov, V D Karabutov, A V Konov, V I Pimenov, S M Prokhorov, A M 0022-3727 1361-6463 IOP Publishing Surfaces, Coatings and Films Acoustics and Ultrasonics Condensed Matter Physics Electronic, Optical and Magnetic Materials http://dx.doi.org/10.1088/0022-3727/32/7/010 Scanning tunnelling microscopy: application to field electron emission studies Journal of Physics D: Applied Physics |
spellingShingle | Frolov, V D, Karabutov, A V, Konov, V I, Pimenov, S M, Prokhorov, A M, Journal of Physics D: Applied Physics, Scanning tunnelling microscopy: application to field electron emission studies, Surfaces, Coatings and Films, Acoustics and Ultrasonics, Condensed Matter Physics, Electronic, Optical and Magnetic Materials |
title | Scanning tunnelling microscopy: application to field electron emission studies |
title_full | Scanning tunnelling microscopy: application to field electron emission studies |
title_fullStr | Scanning tunnelling microscopy: application to field electron emission studies |
title_full_unstemmed | Scanning tunnelling microscopy: application to field electron emission studies |
title_short | Scanning tunnelling microscopy: application to field electron emission studies |
title_sort | scanning tunnelling microscopy: application to field electron emission studies |
title_unstemmed | Scanning tunnelling microscopy: application to field electron emission studies |
topic | Surfaces, Coatings and Films, Acoustics and Ultrasonics, Condensed Matter Physics, Electronic, Optical and Magnetic Materials |
url | http://dx.doi.org/10.1088/0022-3727/32/7/010 |