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Karabutov, A V
Konov, V I
Pimenov, S M
Prokhorov, A M
Frolov, V D
Karabutov, A V
Konov, V I
Pimenov, S M
Prokhorov, A M
author Frolov, V D
Karabutov, A V
Konov, V I
Pimenov, S M
Prokhorov, A M
spellingShingle Frolov, V D
Karabutov, A V
Konov, V I
Pimenov, S M
Prokhorov, A M
Journal of Physics D: Applied Physics
Scanning tunnelling microscopy: application to field electron emission studies
Surfaces, Coatings and Films
Acoustics and Ultrasonics
Condensed Matter Physics
Electronic, Optical and Magnetic Materials
author_sort frolov, v d
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title Scanning tunnelling microscopy: application to field electron emission studies
title_unstemmed Scanning tunnelling microscopy: application to field electron emission studies
title_full Scanning tunnelling microscopy: application to field electron emission studies
title_fullStr Scanning tunnelling microscopy: application to field electron emission studies
title_full_unstemmed Scanning tunnelling microscopy: application to field electron emission studies
title_short Scanning tunnelling microscopy: application to field electron emission studies
title_sort scanning tunnelling microscopy: application to field electron emission studies
topic Surfaces, Coatings and Films
Acoustics and Ultrasonics
Condensed Matter Physics
Electronic, Optical and Magnetic Materials
url http://dx.doi.org/10.1088/0022-3727/32/7/010
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author Frolov, V D, Karabutov, A V, Konov, V I, Pimenov, S M, Prokhorov, A M
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spelling Frolov, V D Karabutov, A V Konov, V I Pimenov, S M Prokhorov, A M 0022-3727 1361-6463 IOP Publishing Surfaces, Coatings and Films Acoustics and Ultrasonics Condensed Matter Physics Electronic, Optical and Magnetic Materials http://dx.doi.org/10.1088/0022-3727/32/7/010 Scanning tunnelling microscopy: application to field electron emission studies Journal of Physics D: Applied Physics
spellingShingle Frolov, V D, Karabutov, A V, Konov, V I, Pimenov, S M, Prokhorov, A M, Journal of Physics D: Applied Physics, Scanning tunnelling microscopy: application to field electron emission studies, Surfaces, Coatings and Films, Acoustics and Ultrasonics, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
title Scanning tunnelling microscopy: application to field electron emission studies
title_full Scanning tunnelling microscopy: application to field electron emission studies
title_fullStr Scanning tunnelling microscopy: application to field electron emission studies
title_full_unstemmed Scanning tunnelling microscopy: application to field electron emission studies
title_short Scanning tunnelling microscopy: application to field electron emission studies
title_sort scanning tunnelling microscopy: application to field electron emission studies
title_unstemmed Scanning tunnelling microscopy: application to field electron emission studies
topic Surfaces, Coatings and Films, Acoustics and Ultrasonics, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
url http://dx.doi.org/10.1088/0022-3727/32/7/010