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Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures
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| Zeitschriftentitel: | Applied Physics Letters |
|---|---|
| Personen und Körperschaften: | , , , , |
| In: | Applied Physics Letters, 61, 1992, 8, S. 916-918 |
| Format: | E-Article |
| Sprache: | Englisch |
| veröffentlicht: |
AIP Publishing
|
| Schlagwörter: |
| author_facet |
Welsch, E. Reichling, M. Göbel, C. Schäfer, D. Matthias, E. Welsch, E. Reichling, M. Göbel, C. Schäfer, D. Matthias, E. |
|---|---|
| author |
Welsch, E. Reichling, M. Göbel, C. Schäfer, D. Matthias, E. |
| spellingShingle |
Welsch, E. Reichling, M. Göbel, C. Schäfer, D. Matthias, E. Applied Physics Letters Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures Physics and Astronomy (miscellaneous) |
| author_sort |
welsch, e. |
| spelling |
Welsch, E. Reichling, M. Göbel, C. Schäfer, D. Matthias, E. 0003-6951 1077-3118 AIP Publishing Physics and Astronomy (miscellaneous) http://dx.doi.org/10.1063/1.107727 <jats:p>Thermal imaging of hidden electric current distributions with a resolution of several ten micrometers is demonstrated. It is shown that the thermoreflectance technique is capable of monitoring current-induced temperature variations on as well as beneath the surface of thin layered structures. A temperature pattern was generated by Joule heating using an ac current in a 2.5 μm thick structured gold film that was evaporated on a glass substrate and covered by a TiOx layer. The current density distribution in the gold film is revealed by the measured photothermal pattern, provided that both laser beam diameter and thermal diffusion length are smaller than the desired lateral resolution.</jats:p> Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures Applied Physics Letters |
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AIP Publishing, 1992 |
| imprint_str_mv |
AIP Publishing, 1992 |
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1077-3118 0003-6951 |
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1992 |
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AIP Publishing |
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| series |
Applied Physics Letters |
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49 |
| title |
Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_unstemmed |
Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_full |
Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_fullStr |
Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_full_unstemmed |
Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_short |
Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_sort |
modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| topic |
Physics and Astronomy (miscellaneous) |
| url |
http://dx.doi.org/10.1063/1.107727 |
| publishDate |
1992 |
| physical |
916-918 |
| description |
<jats:p>Thermal imaging of hidden electric current distributions with a resolution of several ten micrometers is demonstrated. It is shown that the thermoreflectance technique is capable of monitoring current-induced temperature variations on as well as beneath the surface of thin layered structures. A temperature pattern was generated by Joule heating using an ac current in a 2.5 μm thick structured gold film that was evaporated on a glass substrate and covered by a TiOx layer. The current density distribution in the gold film is revealed by the measured photothermal pattern, provided that both laser beam diameter and thermal diffusion length are smaller than the desired lateral resolution.</jats:p> |
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| author | Welsch, E., Reichling, M., Göbel, C., Schäfer, D., Matthias, E. |
| author_facet | Welsch, E., Reichling, M., Göbel, C., Schäfer, D., Matthias, E., Welsch, E., Reichling, M., Göbel, C., Schäfer, D., Matthias, E. |
| author_sort | welsch, e. |
| container_issue | 8 |
| container_start_page | 916 |
| container_title | Applied Physics Letters |
| container_volume | 61 |
| description | <jats:p>Thermal imaging of hidden electric current distributions with a resolution of several ten micrometers is demonstrated. It is shown that the thermoreflectance technique is capable of monitoring current-induced temperature variations on as well as beneath the surface of thin layered structures. A temperature pattern was generated by Joule heating using an ac current in a 2.5 μm thick structured gold film that was evaporated on a glass substrate and covered by a TiOx layer. The current density distribution in the gold film is revealed by the measured photothermal pattern, provided that both laser beam diameter and thermal diffusion length are smaller than the desired lateral resolution.</jats:p> |
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| id | ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTA2My8xLjEwNzcyNw |
| imprint | AIP Publishing, 1992 |
| imprint_str_mv | AIP Publishing, 1992 |
| institution | DE-Pl11, DE-Rs1, DE-14, DE-105, DE-Ch1, DE-L229, DE-D275, DE-Bn3, DE-Brt1, DE-D161, DE-Zi4, DE-Gla1, DE-15 |
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| physical | 916-918 |
| publishDate | 1992 |
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| publisher | AIP Publishing |
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| recordtype | ai |
| series | Applied Physics Letters |
| source_id | 49 |
| spelling | Welsch, E. Reichling, M. Göbel, C. Schäfer, D. Matthias, E. 0003-6951 1077-3118 AIP Publishing Physics and Astronomy (miscellaneous) http://dx.doi.org/10.1063/1.107727 <jats:p>Thermal imaging of hidden electric current distributions with a resolution of several ten micrometers is demonstrated. It is shown that the thermoreflectance technique is capable of monitoring current-induced temperature variations on as well as beneath the surface of thin layered structures. A temperature pattern was generated by Joule heating using an ac current in a 2.5 μm thick structured gold film that was evaporated on a glass substrate and covered by a TiOx layer. The current density distribution in the gold film is revealed by the measured photothermal pattern, provided that both laser beam diameter and thermal diffusion length are smaller than the desired lateral resolution.</jats:p> Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures Applied Physics Letters |
| spellingShingle | Welsch, E., Reichling, M., Göbel, C., Schäfer, D., Matthias, E., Applied Physics Letters, Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures, Physics and Astronomy (miscellaneous) |
| title | Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_full | Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_fullStr | Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_full_unstemmed | Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_short | Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_sort | modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| title_unstemmed | Modulated thermoreflectance imaging of hidden electric current distributions in thin-film layered structures |
| topic | Physics and Astronomy (miscellaneous) |
| url | http://dx.doi.org/10.1063/1.107727 |