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Analog IC Reliability in Nanometer CMOS

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Authors and Corporations: Maricau, Elie (Author), Gielen, Georges (Other)
Title: Analog IC Reliability in Nanometer CMOS/ by Elie Maricau, Georges Gielen
Type of Resource: E-Book
Language: English
published:
New York, NY Springer 2013
Series: Analog Circuits and Signal Processing
SpringerLink
Subjects:
Electronics
Systems engineering
Engineering
Source: Verbunddaten SWB
Access Information: Elektronischer Volltext - Campuslizenz