Analog IC Reliability in Nanometer CMOS

Gespeichert in:

Personen und Körperschaften:	Maricau, Elie (VerfasserIn), Gielen, Georges (Sonstige)
Titel:	Analog IC Reliability in Nanometer CMOS/ by Elie Maricau, Georges Gielen
Format:	E-Book
Sprache:	Englisch
veröffentlicht:	New York, NY Springer 2013
Gesamtaufnahme:	Analog Circuits and Signal Processing SpringerLink
Schlagwörter:	Electronics Systems engineering Engineering
Quelle:	Verbunddaten SWB
Zugangsinformationen:	Elektronischer Volltext - Campuslizenz


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spellingShingle	Maricau, Elie, Analog IC Reliability in Nanometer CMOS, Electronics, Systems engineering, Engineering
swb_id_str	37852013X
title	Analog IC Reliability in Nanometer CMOS
title_auth	Analog IC Reliability in Nanometer CMOS
title_full	Analog IC Reliability in Nanometer CMOS by Elie Maricau, Georges Gielen
title_fullStr	Analog IC Reliability in Nanometer CMOS by Elie Maricau, Georges Gielen
title_full_unstemmed	Analog IC Reliability in Nanometer CMOS by Elie Maricau, Georges Gielen
title_short	Analog IC Reliability in Nanometer CMOS
title_sort	analog ic reliability in nanometer cmos
title_unstemmed	Analog IC Reliability in Nanometer CMOS
topic	Electronics, Systems engineering, Engineering
topic_facet	Electronics, Systems engineering, Engineering
url	https://doi.org/10.1007/978-1-4614-6163-0, https://swbplus.bsz-bw.de/bsz37852013xcov.jpg, http://dx.doi.org/10.1007/978-1-4614-6163-0
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