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Signal Measurement and Estimation Techniques for Micro and Nanotechnology

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Personen und Körperschaften: Clévy, Cédric (VerfasserIn), Rakotondrabe, Micky (Sonstige), Chaillet, Nicolas (Sonstige)
Titel: Signal Measurement and Estimation Techniques for Micro and Nanotechnology/ edited by Cédric Clévy, Micky Rakotondrabe, Nicolas Chaillet
Format: E-Book Konferenzbericht Bibliografie
Sprache: Englisch
veröffentlicht:
New York, NY Springer New York 2011
Gesamtaufnahme: SpringerLink
Schlagwörter:
Engineering
Konferenzschrift
Bibliografie
Buchausg. u.d.T.: Signal measurement and estimation techniques for micro and nanotechnology, Dortrecht, Heidelberg [u.a.] : Springer, 2011, X, 242 S.
Quelle: Verbunddaten SWB
Zugangsinformationen: Elektronischer Volltext - Campuslizenz
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spelling Clévy, Cédric aut, Signal Measurement and Estimation Techniques for Micro and Nanotechnology edited by Cédric Clévy, Micky Rakotondrabe, Nicolas Chaillet, New York, NY Springer New York 2011, Online-Ressource (X, 242p. 155 illus, digital), Text txt rdacontent, Computermedien c rdamedia, Online-Ressource cr rdacarrier, SpringerLink Bücher, Engineering, Konferenzschrift (DE-588)1071861417 (DE-627)826484824 (DE-576)433375485 gnd-content, Bibliografie (DE-588)4006432-3 (DE-627)104814519 (DE-576)208865578 gnd-content, s (DE-588)4054936-7 (DE-627)106160354 (DE-576)209111399 Signal gnd, s (DE-588)4038852-9 (DE-627)104419164 (DE-576)209032359 Messung gnd, s (DE-588)4327470-5 (DE-627)131523066 (DE-576)211282081 Nanotechnologie gnd, (DE-627), Rakotondrabe, Micky oth, Chaillet, Nicolas oth, 9781441999450, Buchausg. u.d.T. Signal measurement and estimation techniques for micro and nanotechnology Dortrecht, Heidelberg [u.a.] : Springer, 2011 X, 242 S. (DE-627)667053883 (DE-576)348551304 9781441999450, https://doi.org/10.1007/978-1-4419-9946-7 Verlag Volltext, http://dx.doi.org/10.1007/978-1-4419-9946-7 DE-Ch1, DE-Ch1 epn:3340934053 2011-08-17T09:15:50Z, DE-105 epn:3340934061 2018-03-14T09:43:23Z, http://dx.doi.org/10.1007/978-1-4419-9946-7 DE-Zwi2, DE-Zwi2 epn:3340934096 2011-08-17T09:15:50Z, http://dx.doi.org/10.1007/978-1-4419-9946-7 Zum Online-Dokument DE-Zi4, DE-Zi4 epn:3340934142 2011-08-17T09:15:50Z, http://dx.doi.org/10.1007/978-1-4419-9946-7 HTWK-Zugang DE-L189, DE-L189 epn:3340934193 2013-12-13T10:38:55Z, http://dx.doi.org/10.1007/978-1-4419-9946-7 DE-520, DE-520 epn:3340934223 2011-08-17T09:15:50Z
spellingShingle Clévy, Cédric, Signal Measurement and Estimation Techniques for Micro and Nanotechnology, Engineering, Konferenzschrift, Bibliografie, Signal, Messung, Nanotechnologie
swb_id_str 348695799
title Signal Measurement and Estimation Techniques for Micro and Nanotechnology
title_auth Signal Measurement and Estimation Techniques for Micro and Nanotechnology
title_full Signal Measurement and Estimation Techniques for Micro and Nanotechnology edited by Cédric Clévy, Micky Rakotondrabe, Nicolas Chaillet
title_fullStr Signal Measurement and Estimation Techniques for Micro and Nanotechnology edited by Cédric Clévy, Micky Rakotondrabe, Nicolas Chaillet
title_full_unstemmed Signal Measurement and Estimation Techniques for Micro and Nanotechnology edited by Cédric Clévy, Micky Rakotondrabe, Nicolas Chaillet
title_short Signal Measurement and Estimation Techniques for Micro and Nanotechnology
title_sort signal measurement and estimation techniques for micro and nanotechnology
title_unstemmed Signal Measurement and Estimation Techniques for Micro and Nanotechnology
topic Engineering, Konferenzschrift, Bibliografie, Signal, Messung, Nanotechnologie
topic_facet Engineering, Konferenzschrift, Bibliografie, Signal, Messung, Nanotechnologie
url https://doi.org/10.1007/978-1-4419-9946-7, http://dx.doi.org/10.1007/978-1-4419-9946-7
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