A 0.25µm logarithmic CMOS imager for emissivity-compensated thermography
Challenges in the design of solid-state imagers for industrial measurement and control include: high image resolution, wide temperature range, adequate temperature resolution, high measurement speed, thermal stability of the sensor chip, and most importantly, low cost. However, they have the inheren...
|Journal Title:||2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers|
|Authors and Corporations:||, , , , ,|
|In:||2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, 2009, p. 354-355|
|Type of Resource:||E-Article|