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Extreme Statistics in Nanoscale Memory Design

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Authors and Corporations: Singhee, Amith (Author), Rutenbar, Rob A. (Other)
Title: Extreme Statistics in Nanoscale Memory Design/ edited by Amith Singhee, Rob A. Rutenbar
Edition: 1
Type of Resource: E-Book
Language: English
published:
Boston, MA Springer Science+Business Media LLC 2010
Series: Integrated Circuits and Systems
SpringerLink
Subjects:
Electronics
Systems engineering
Engineering
Source: Verbunddaten SWB
Access Information: Elektronischer Volltext - Campuslizenz