Author Search Results

1

Hadronic Production of Charmed Particles. : Recent Results from the NA32 Experiment: Recent Results from the NA32 Experiment

by BOSMAN, M.
Published in Annals of the New York Academy of Sciences (1988)

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2

The political rhetoric of corporate globalisation and the possibilities for counter‐hegemonic Projects

by Bosman, M. Martin
Published in Space and Polity (1999)

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3

A staining method to intensify a specific high molecular weight glutenin band and the calculation of the relative protein content of the band with laser densitometer scans

by Bosman, M., Agenbag, G. A.
Published in South African Journal of Plant and Soil (1998)

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4

How to Manage Data of Gas Compressors and Instrumentation

by Lammerse, H., Bosman, M.
Published in International Journal of Quality & Reliability Management (1984)

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5

Applications and theoretical simulation of low-loss electron energy-loss spectra

by Keast, V. J., Bosman, M.
Published in Materials Science and Technology (2008)

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6

Measuring the Digital Divide in the United States: Race, Income, and Personal Computer Ownership

by Chakraborty, Jayajit, Bosman, M. Martin
Published in The Professional Geographer (2005)

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7

The use of acid Polyacrylamide gel electrophoresis to determine the effect of locality of growth on the protein profiles of barley, wheat and honeybush tea

by de Villiers, O. T., Bosman, M.
Published in South African Journal of Plant and Soil (1997)

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8

Analysis of the HMW glutenin subunit composition of wheat cultivare by SDS-PAGE

by de Villiers, O. T., Bosman, M.
Published in South African Journal of Plant and Soil (1996)

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9

Wheat cultivar identification by electrophoretic analysis of gliadin proteins

by de Villiers, O. T., Bosman, M.
Published in South African Journal of Plant and Soil (1993)

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10

Spectroscopy of SILC trap locations and spatial correlation study of percolation path in the high-κ and interfacial layer

by Raghavan, N., Bosman, M., Pey, K. L.
Published in 2015 IEEE International Reliability Physics Symposium (2015)

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11

Recasting neo-liberalism in the americas: A critique of the preliminary needs assessment of the millennium development goals in the dominican republic

by Martin Bosman, M., Mark Amen, M.
Published in Globalizations (2006)

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12

Predicting the Creep Lifetime of HMPE Mooring Rope Applications

by Vlasblom, M.P., Bosman, M.R.L.
Published in OCEANS 2006 (2006)

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13

Electrophoresis of leaf and seed proteins of Englerophytum natalense (fam. Sapotaceae)

by Ham, H., Bosman, M., Vorster, P. J.
Published in South African Journal of Plant and Soil (2001)

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14

Otitis externa by Pseudomonas aeruginosa associated with whirlpools

by Havelaar, A. H., Bosman, M., Borst, J.
Published in Journal of Hygiene (1983)

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15

Theoretical Study of Ag Interactions in Amorphous Silica RRAM Devices

by Patel, K., Cottom, J., Bosman, M., Kenyon, A. J., Shluger, A. L.
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (2018)

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16

Statistical basis and physical evidence for clustering model in FinFET degradation

by Mei, S., Raghavan, N., Bosman, M., Pey, K.L.
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (2017)

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17

Multiphysics based 3D percolation framework model for multi-stage degradation and breakdown in high-κ — Interfacial layer stacks

by Mei, S., Raghavan, N., Shubhakar, K., Bosman, M., Pey, K. L.
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (2016)

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18

Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM

by Raghavan, N., Frey, D. D., Bosman, M., Pey, K. L.
Published in 2015 IEEE International Reliability Physics Symposium (2015)

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19

Modified Percolation Model for Polycrystalline High-$ \kappa$ Gate Stack With Grain Boundary Defects

by Raghavan, N, Pey, K L, Shubhakar, K, Bosman, M
Published in IEEE Electron Device Letters (2011)

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20

Study of ion beam damage on FIB prepared TEM samples

by Tang, L.J., Zhang, Y.J., Bosman, M., Jasmine Woo
Published in 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (2010)

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